A Metallography Contest featuring colour and B/W microstructures obtained by Optical Microscope (OM), Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM) will be held as a part of ATM. Besides aesthetics, novelty of scientific information and imaging technique, innovative methods of sample preparation should be indicated. Those intending to participate must register as delegates in advance, and the entries are to be brought and fixed by them at the conference venue. The entries should contain on the face of the mount the following information:

Category (OM/SEM/TEM), Title, Metal/alloy studied, Fabrication and thermal history, Magnification, Etchant and Etching technique.